X射線譜致力于快速發(fā)表論文處理x射線光譜法的理論和應用使用電子,X射線光子,質子,γ和γ-X來源。涵蓋了先進的技術，方法和設備，這個建立的期刊為討論更復雜的x射線分析方法提供了理想的平臺。包括波長和能量色散系統(tǒng)，以及一系列數據處理方法，從最簡單的到非常復雜的軟件程序。有關X射線光譜分析方法在結構分析方面的應用的論文，以及涉及環(huán)境分析和監(jiān)測、藝術和古物學研究、礦物學、法醫(yī)學、地質學、表面科學和材料分析、生物醫(yī)學和藥物應用等廣泛領域的應用論文，也都是專題報道。

X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources.Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods.Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.